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TWP - Multi channel Thermal Wireless Profiler

TWP

Multi channel, Thermal wireless profiler for semiconductor processes setup

 

 

 

MXR High power Microscope

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MXR Semiconductor inspection microscope

High power - cost effective microscope for wafer inspection

 

TCWafers

Thermocouple instrumented Wafers

Thermocouple instrumented wafers for any kind of process control need, from low to extremely high temperatures, from 4 to 12"

 

 

 

PC Profiling Software

PC Software for thermal profiling

A powerful and easy to use software for PC for a complete thermal profiling on TC Wafers to interface Thermal Wireless Profilers  

 

 

 

 

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